| 適配標(biāo)準(zhǔn) Standard | IEC60904-9:2020 | IEC60904-9:2020 |
| 光源類型 Light type | 氙燈穩(wěn)態(tài)光源 | Xenon Lamp |
| 冷卻方式 Cooling | 定制風(fēng)冷 | Forced air cooling |
| 光源壽命 Light source lifetime | >1000h | >1000h |
| 光譜范圍 Spectrum wavelength | 300-1200nm | 300-1200nm |
| 光源等級 Classfication of light source | 光譜匹配度 0.875-1.125 A+ 輻照度不均勻度 ≤1% A+ 輻照度不穩(wěn)定度 ≤1% A+ | Spectral match is 0.875-1.125, class A+ Irradiance non-uniformity is ≤1%, class A+ Irradiance instability is ≤1%, class A+ |
| 輻照度范圍 Irradiance intensity | 200W/㎡~1200W/㎡ | 200W/㎡~1200W/㎡ |
| 測試面積 Illumination area | ? 1200*600mm ? 2600*1400mm? 可定制其他尺寸 | ? 1200*600mm ? 2600*1400mm? Other size can be customized |
| 測試模式 Test mode | 穩(wěn)態(tài)測試模式可自由設(shè)定由1s到連續(xù)照光 | Under steady-state mode, it can be set freely from 1s to continuous illumination. Besides |
| 多通道設(shè)計 Multi-channel testing design | 可實現(xiàn)36通道同時測試,通道數(shù)量可定制 | 36 channels can be tested simultaneously, and the number of channels can be customized |
| 測試技術(shù) Testing technology | 標(biāo)配I-V、V-I掃描方式,具備MPPT(最大功率點追蹤)、I-t(定電壓)等多種測試技術(shù),可通過軟件切換,同時集成逐點掃描方式(滿足最短≤0.2s步進(jìn)的掃描方式) | It equipped with I-V, V-I scanning, MPPT (maximum power point tracking), I-t (constant voltage) and other test technologies, all these technologies can be switched by software. It also equipped point-by-point scanning ( meet the shortest scanning in step of ≤0.2s |
| 測試電池 Measurable cell type | 多晶、單晶、Topcon、BC、異質(zhì)結(jié)、CIGS、GaAs、CdTe、鈣鈦礦、鈣鈦礦疊層等 | Poly-crystalline, Mono-crystalline, TopCon, HJT, BC,CIGS, GaAs, CdTe and Perovskite |
| 可增配項 Optional service | ? 集成溫控系統(tǒng),實現(xiàn)溫度系數(shù)測試 ? 集成EL測試系統(tǒng),實現(xiàn)同工位IV/EL測試 ? 集成IR紅外熱像儀,實現(xiàn)熱斑測試 | ? Temperature Chamber can be integrated to achieve measurement of temperature coefficient ? EL testing system can achieve IV and EL testing at a same production section ? Integrated with IR infrared thermal imager to realize heat spot testing |
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